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Reference Report for CAIN779054029
Title:Influence of soybean dwarf virus on growth and yield [Transmitted by Aulacorthum solani, vector]
Authors:Ghosh, N., Gotoh, K., Mori, Y., Nakaseko, K.
Source:Proc. Crop Sci. Soc. Jap. 1976, 45(4):624-629.
Abstract:Differences in growth and yield between infected (I) and protected (P) soybean plants were analyzed from the viewpoint of growth analysis, using varieties Adams, Yuzuru and their 13 F3 lines. Total dry wt (except root) and leaf area in infected plants were lower at the first sampling date (July 17) than protected ones and the differences between P and I plots increased with time. Adams had more total dry wt and leaf area than Yuzuru in P and I plots. Four different growth patterns, showing same and/or intermediate patterns between parental varieties, were found among the F3 lines. Values of crop growth rate (CGR) and mean leaf area (LA) per plant in I plot were much lower than those in P plot, showing parallelism between them. Net assimilation rate (NAR) in the I plot was lower at stage I (July 18-Aug. 17), but higher at stage II (Aug. 18-Aug. 27) than those in P plot. Plants in I plot had lower value for specific leaf area (Sp. LA) than those in P plot. Plants in I plot had higher dry matter percentage and lower N level in leaves than those in P plot. CGR was closely related with LA. NAR was significantly correlated with CGR in stage I, but the regression line differed between P and I plots. In stage II, NAR in I plot was not correlated with CGR, though in P plot there was high positive correlation. Seed yield in I plot was highly correlated with leaf area, indicating that the decrease in growth and yield in I plot was mainly due to leaf area. Relative leaf growth rate (RLGR) had high positive correlation with NAR in P and I plots. In I plot at stage I, Sp. LA was also correlated significantly with RLGR.






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